© IEEEE CASS Daegu Chapter (Chair : Kyung Ki Kim, kkkim@daegu.ac.kr)

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Program at a glance

Thursday (April 27, 2017)

​18:00-20:00

Welcome Reception  (Amante, Hotel Inter-Burgo Daegu, Korea)

HOT
Friday (April 28, 2017)

​09:00-10:30

1. Opening Ceremony

2. The CAS Society in general and its initiatives

3. The CASS Conference Policy

4. The regional and local activities (and WiCAS-YP
activities) in CASS

10:30 - 11:15

Invited Talk1 :

Prof. Franco Maloberti (University of Pavia, Italy)

Power Efficient Data Converters

11:15 - 11:30

Coffee Break

11:30 - 12:00

Invited Talk2: 

Prof. Myung Hoon Sunwoo (Ajou Unversity, Korea)

ICT-based Convergence Technologies Changing Paradigm of Health Care and Disease Diagnosis

12:00 - 12:30

Invited Talk3: 

Prof. Yoshifumi Nishio (Tokushima University, Japan)

Chaos Applications and Complex Phenomena in Chaotic Circuit Networks

12:30 - 13:30

Lunch.

Saturday (April 29, 2017)

​9:00-10:30

Technical Program #2

1. Image Quality Enhancement Techniques for Reality Enhancement

Prof. Sung-in Cho (Daegu University, Korea)

 

2. Energy-efficient ECC solutions for healthy NAND flash memories

Prof. Youngjoo Lee (POSTECH, Korea)

 

3. Process Variation-Tolerant Processor Design: Architectural Approaches

Prof. Joonho Kong

  (Kyungpook National University, Korea)

​10:30-11:00

Coffee Breaks

11:00 - 12:30

Technical Program #3

1. ICs and Microsystems for Emerging Biomedical Applications

Prof. Minkyu Je (KAIST, Korea)

 

2. Supply and Temperature Insensitive Capacitance-to-digital Converters for Low Power Applications.

Dr. Arup K. George  (Dgist, Korea)

 

3. Head Model-Based Latency Measurement and Compensation Systems for Head Mounted Displays

Prof. Suk-Ju Kang (Sogang University, Korea)

Technical Program #1​

13:30 - 14:15

1. Novel Ternary Arithmetic Designs based on Ternary CMOS Compact Model​

Prof. Seokhyeong Kang (UNIST, Korea)

​14:15 - 15:00

2. Wireless Power Transfer System Design for Wearable Devices

Prof. Jun Rim Choi
(Kyungpook National University, Korea)

​15:00 - 15:30

Coffee Break

​12:30 - 13:30

Lunch

​13:30 - 18:00

Tour

​18:00 - 20:00

Closing & Farewell Party (Gyeongju)

​15:30 - 16:15

3. A Coefficient-Error-Robust FFE Tx with 230% Eye Variation Improvement without Calibration in 65-nm CMOS Technology

Prof. Byungsub Kim (POSTECH, Korea)

​16:15 - 17:30

Poster Session

​18:00 - 20:00

Banquet