Program at a glance
Thursday (April 27, 2017)
18:00-20:00
Welcome Reception (Amante, Hotel Inter-Burgo Daegu, Korea)
HOT
Friday (April 28, 2017)
09:00-10:30
1. Opening Ceremony
2. The CAS Society in general and its initiatives
3. The CASS Conference Policy
4. The regional and local activities (and WiCAS-YP
activities) in CASS
10:30 - 11:15
Invited Talk1 :
Prof. Franco Maloberti (University of Pavia, Italy)
Power Efficient Data Converters
11:15 - 11:30
Coffee Break
11:30 - 12:00
Invited Talk2:
Prof. Myung Hoon Sunwoo (Ajou Unversity, Korea)
ICT-based Convergence Technologies Changing Paradigm of Health Care and Disease Diagnosis
12:00 - 12:30
Invited Talk3:
Prof. Yoshifumi Nishio (Tokushima University, Japan)
Chaos Applications and Complex Phenomena in Chaotic Circuit Networks
12:30 - 13:30
Lunch.
Saturday (April 29, 2017)
9:00-10:30
Technical Program #2
1. Image Quality Enhancement Techniques for Reality Enhancement
Prof. Sung-in Cho (Daegu University, Korea)
2. Energy-efficient ECC solutions for healthy NAND flash memories
Prof. Youngjoo Lee (POSTECH, Korea)
3. Process Variation-Tolerant Processor Design: Architectural Approaches
Prof. Joonho Kong
(Kyungpook National University, Korea)
10:30-11:00
Coffee Breaks
11:00 - 12:30
Technical Program #3
1. ICs and Microsystems for Emerging Biomedical Applications
Prof. Minkyu Je (KAIST, Korea)
2. Supply and Temperature Insensitive Capacitance-to-digital Converters for Low Power Applications.
Dr. Arup K. George (Dgist, Korea)
3. Head Model-Based Latency Measurement and Compensation Systems for Head Mounted Displays
Prof. Suk-Ju Kang (Sogang University, Korea)
Technical Program #1
13:30 - 14:15
1. Novel Ternary Arithmetic Designs based on Ternary CMOS Compact Model
Prof. Seokhyeong Kang (UNIST, Korea)
14:15 - 15:00
2. Wireless Power Transfer System Design for Wearable Devices
Prof. Jun Rim Choi
(Kyungpook National University, Korea)
15:00 - 15:30
Coffee Break
12:30 - 13:30
Lunch
13:30 - 18:00
Tour
18:00 - 20:00
Closing & Farewell Party (Gyeongju)
15:30 - 16:15
3. A Coefficient-Error-Robust FFE Tx with 230% Eye Variation Improvement without Calibration in 65-nm CMOS Technology
Prof. Byungsub Kim (POSTECH, Korea)
16:15 - 17:30
Poster Session
18:00 - 20:00
Banquet